Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical Microscopy
نویسندگان
چکیده
منابع مشابه
Multifunctional carbon nanoelectrodes fabricated by focused ion beam milling.
We report a strategy for fabrication of sub-micron, multifunctional carbon electrodes and application of these electrodes as probes for scanning electrochemical microscopy (SECM) and scanning ion conductance microscopy (SICM). The fabrication process utilized chemical vapor deposition of parylene, followed by thermal pyrolysis to form conductive carbon and then further deposition of parylene to...
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ژورنال
عنوان ژورنال: Journal of The Electrochemical Society
سال: 2015
ISSN: 0013-4651,1945-7111
DOI: 10.1149/2.0071604jes